Substrate processing apparatus and substrate processing method

ABSTRACT

A substrate processing apparatus that processes a substrate using particles, includes a conveyance mechanism configured to convey the substrate along a conveyance surface, a particle source configured to emit particles, a rotation mechanism configured to make the particle source pivot about a rotation axis, and a movement mechanism configured to move the particle source such that a distance between the particle source and the conveyance surface is changed.

CROSS-REFERENCE TO RELATED APPLICATION(S)

This application is a continuation of International Patent ApplicationNo. PCT/JP2019/003362 filed on Jan. 31, 2019, which claims priority toand the benefit of Japanese Patent Application No. 2018-019569 filed onFeb. 6, 2018, the entire disclosures of which are incorporated herein byreference.

TECHNICAL FIELD

The present invention relates to a substrate processing apparatus and asubstrate processing method.

BACKGROUND ART

There is a substrate processing apparatus that processes a substrateusing particles emitted from a particle source. The particle source canbe, for example, a target held by a cathode, or an ion beam source. Whenthe particle source is a target, the substrate processing apparatus canbe used as a sputtering apparatus (deposition apparatus). When theparticle source is an ion beam source, the substrate processingapparatus can be used as an etching apparatus or an ion implantationapparatus.

PTL 1 discloses a deposition apparatus that forms a thin film on a basehaving an uneven shape. The deposition apparatus described in PTL 1includes a cathode unit rotatable about an axis in a Y direction, arotating shaft that rotates a base holder, a driving system that drivesthe rotating shaft in its axial direction, and a driving system thatswings the rotating shaft in an X-Z plane.

CITATION LIST Patent Literature

PTL 1: Japanese Patent Laid-Open No. 2005-336535

SUMMARY OF INVENTION Technical Problem

In the arrangement in which the posture (inclination) and position of asubstrate (base) are controlled as in the deposition apparatus describedin PTL 1, when a film is formed on a substrate having a concave shape,the range in which the distance between the target and the substrate andthe relative posture between the target and the substrate can beadjusted can be limited. In order to increase the adjustable range, itis required to increase the adjustment range of the posture and positionof the substrate and the pivot range of the cathode unit, but this canlead to an increase in size of the deposition apparatus.

The present invention has as its object to provide a techniqueadvantageous in adjusting the distance between a particle source and asubstrate and the relative posture between the particle source and thesubstrate.

Solution to Problem

The first aspect of the present invention relates to a substrateprocessing apparatus that processes a substrate using particles. Thesubstrate processing apparatus comprises a conveyance mechanismconfigured to convey the substrate along a conveyance surface, aparticle source configured to emit particles, a rotation mechanismconfigured to make the particle source pivot about a rotation axis, anda movement mechanism configured to move the particle source such that adistance between the particle source and the conveyance surface ischanged.

The second aspect of the present invention relates to a substrateprocessing method of processing a substrate. The substrate processingmethod comprises a processing step of processing the substrate usingparticles emitted from a particle source while conveying the substratealong a conveyance surface and controlling a posture and a position ofthe particle source that emits particles, wherein a target processingportion of the substrate changes as the substrate is conveyed, and theprocessing step includes a driving step of, in accordance with a changeof the target processing portion of the substrate, making the particlesource pivot about a rotation axis and moving the particle source suchthat a distance between the particle source and the conveyance surfaceis changed.

Advantageous Effects of Invention

According to the present invention, a technique advantageous inadjusting the distance between a particle source and a substrate and therelative posture between the particle source and the substrate isprovided.

Other features and advantages of the present invention will becomeapparent from the description provided hereinafter with reference to theaccompanying drawings. Note that the same reference numerals denote thesame or similar components in the accompanying drawings.

BRIEF DESCRIPTION OF DRAWINGS

FIG. 1 is a view schematically showing the arrangement of a sputteringapparatus according to the first embodiment of the present invention;

FIG. 2 is a view schematically showing the arrangement of a sputteringapparatus according to the second embodiment of the present invention;

FIG. 3 is a view schematically showing adjustment or control of theposture and position of a target (cathode) that can be performed by arotation mechanism and a movement mechanism under the control of acontrol unit;

FIG. 4 is a view showing, in time series, a process in which a film isformed on a substrate by sputtering in the sputtering apparatus;

FIG. 5 is a view showing, in time series, the process in which the filmis formed on the substrate by sputtering in the sputtering apparatus;

FIG. 6 is a view showing, in time series, the process in which the filmis formed on the substrate by sputtering in the sputtering apparatus;and

FIG. 7 is a view schematically showing the arrangement of a sputteringapparatus according to the second embodiment of the present invention.

DESCRIPTION OF EMBODIMENTS

Hereinafter, embodiments of the present invention will be explained indetail with reference to the accompanying drawings. It is to beunderstood that the following embodiments are not intended to limit theclaims of the present invention. A plurality of features are describedin the embodiments, but all of the plurality of features are notnecessarily essential to the present invention, and the plurality offeatures may be arbitrarily combined. The same reference numerals denotethe same or similar components in the accompanying drawings, and arepetitive description thereof will be omitted.

The present invention will be described below through its exemplaryembodiments with reference to the accompanying drawings. The presentinvention relates to a substrate processing apparatus and a substrateprocessing method for processing a substrate using particles emittedfrom a particle source. The particle source is, for example, a targetheld by a cathode, and the substrate processing apparatus can beconfigured as a sputtering apparatus that forms a film on a substrateusing particles emitted by sputtering of the cathode. Alternatively, theparticle source is an ion beam source, and the substrate processingapparatus can be configured as an etching apparatus that etches asubstrate using particles emitted from the ion beam source, or an ionimplantation apparatus that implants particles emitted from the ion beamsource into a substrate.

An example in which the substrate processing apparatus according to thepresent invention is applied to a sputtering apparatus will be describedbelow. However, by replacing the particle source in the followingdescription with an ion beam source, the substrate processing apparatusdescribed below can function as an etching apparatus that etches asubstrate or an ion implantation apparatus that implants ions into asubstrate.

FIG. 1 schematically shows the arrangement of a sputtering apparatus 1according to the first embodiment of the present invention. Thesputtering apparatus 1 can include a sputtering chamber CA, a conveyancemechanism CMA that conveys a substrate S along a conveyance surface CSin the sputtering chamber CA, and a cathode C that holds a target T(particle source) in the sputtering chamber CA. The sputtering apparatus1 can further include a rotation mechanism RTM that makes the cathode Cpivot about a rotation axis, and a movement mechanism RVM that moves thecathode C such that the distance between the cathode C and theconveyance surface CS is changed. Here, the distance between the cathodeC and the conveyance surface CS can be adjusted or controlled by themovement mechanism RVM such that the distance between the target T and afilm formation portion of the substrate S is set to a predetermineddistance.

The substrate S includes, for example, a surface having a concave shape,and a film can be formed on the surface by sputtering. The surface canbe, for example, a surface forming a part of a cylindrical surface, asurface forming a part of a spherical surface, or a paraboloid, but mayhave another shape. The present invention is advantageous in forming afilm on a concave surface of a substrate, but may be applied to form afilm on a convex surface of a substrate.

The substrate S can be conveyed by the conveyance mechanism CMA alongthe conveyance surface CS while being held by a substrate holder SH. Thesubstrate S can be, for example, a base material or a base of an opticalelement such as a mirror. The conveyance mechanism CMA can be, forexample, a roller conveyor, but may be another type of conveyancemechanism.

In addition, the sputtering apparatus 1 can include a vacuum pump (forexample, a turbo molecular pump, a dry pump, a cryopump, or the like)for reducing the pressure in the internal space of the sputteringchamber CA. Further, the sputtering apparatus 1 can include a gas supplyunit that supplies a gas (for example, an argon gas) to the internalspace of the sputtering chamber CA. Furthermore, the sputteringapparatus 1 can include a high-frequency supply source that supplies ahigh frequency between the cathode C and the substrate S and/or thesputtering chamber CA.

The sputtering apparatus 1 may further include a load lock chamber CB.The load lock chamber CB can be connected to the sputtering chamber CAvia a gate valve V1. In the load lock chamber CB, a vacuum pump thatreduces the pressure in the internal space of the load lock chamber CBcan be provided. Further, a conveyance mechanism CMB for conveying thesubstrate S in the load lock chamber CB can be provided in the load lockchamber CB. A heater HT that heats the substrate S may be provided inthe load lock chamber CB.

The sputtering apparatus 1 can include a port CC that provides a relayplace for loading the substrate S into the load lock chamber CB andunloading the substrate S from the load lock chamber CB. The port CC canbe connected to the load lock chamber CB via a gate valve V2. In theport CC, a conveyance mechanism CMC for conveying the substrate S in theport CC can be provided. In addition, a measurement device MEAS formeasuring the shape of the surface of the substrate S can be provided inthe port CC. The measurement device MEAS can be, for example, athree-dimensional shape measurement device. The measurement device MEAScan, for example, measure the shape of the surface of the substrate S ina state in which the substrate S is scanned by the conveyance mechanismCMC, and generate surface shape information.

The sputtering apparatus 1 can include a control unit CNT that controlsthe conveyance mechanisms CMA, CMB, and CMC, the rotation mechanism RTM,the movement mechanism RVM, the heater HT, and the measurement deviceMEAS. The control unit CNT can be formed from, for example, a PLD (theabbreviation of a Programmable Logic Device) such as an FPGA (theabbreviation of a Field Programmable Gate Array), an ASIC (theabbreviation of an Application Specific Integrated Circuit), ageneral-purpose computer installed with a program, or a combination ofall or some of these components.

In the example shown in FIG. 1, the substrate S can be loaded into theport CC and conveyed to the load lock chamber CB via the gate valve V2by the conveyance mechanisms CMC and CMB. Here, when the shape of thesurface of the substrate S is unknown, it can be measured by themeasurement device MEAS. Based on surface shape information (informationindicating the shape of the surface of the substrate S) obtained as aresult of measurement by the measurement device MEAS or surface shapeinformation of the substrate S provided via an input device (not shown),the control unit CNT can generate control information to control therotation mechanism RTM and the movement mechanism RVM.

When the substrate S is loaded into the load lock chamber CB, thepressure in the internal space of the load lock chamber CB can bereduced. In addition, as needed, the substrate S can be heated by theheater HT. After that, the substrate S can be conveyed to the internalspace of the sputtering chamber CA via the gate valve V1 by theconveyance mechanisms CMB and CMA.

In the sputtering chamber CA, a film forming step can be performed inwhich a film is formed on the substrate S by sputtering while conveyingthe substrate S in a first conveyance direction along the conveyancesurface CS and controlling the posture and position of the cathode Cholding the target T. A film formation portion, which is a portion wherea film is formed (a portion where a film grows) of the entire surface ofthe substrate S, can change as the substrate S is conveyed by theconveyance mechanism CMA. Here, it can be said that a film formationportion is a portion to be processed, that is, a target processingportion. The film forming step can include a driving step of, inaccordance with a change of the film formation portion of the substrateS, making the cathode C pivot about the rotation axis and moving thecathode C such that the distance between the cathode C and theconveyance surface CS is changed. In the driving step, the distancebetween the cathode C and the conveyance surface CS can be adjusted orcontrolled by the driving mechanism RVM such that the distance betweenthe target T and the film formation portion of the substrate S is set toa predetermined distance.

After the film is formed on the entire surface (or the entire regionwhere the film is to be formed) of the substrate S, the substrate S isconveyed by the conveyance mechanism CMA in a second conveyancedirection opposite to the first conveyance direction, and furtherconveyed to the internal space of the load lock chamber CB via the gatevalve V1 by the conveyance mechanisms CMA and CMB. After that, thepressure in the load lock chamber CB is returned to the atmosphericpressure, and the substrate S can be conveyed to the port CC by theconveyance mechanisms CMB and CMC.

FIG. 2 schematically shows an example of the arrangements of therotation mechanism RTM and the movement mechanism RVM. FIG. 3schematically shows adjustment or control of the posture and position ofthe target T (cathode C) that can be performed by the rotation mechanismRTM and the movement mechanism RVM under the control of the control unitCNT. The movement mechanism RVM can be embodied as, for example, arevolution mechanism that moves the cathode C, by making the cathode Cpivot along a revolution orbit OB, such that the distance between thecathode C and the conveyance surface CS (film formation portion DP) ischanged. The movement mechanism RVM can include, for example, a motor12, a rotating shaft 16 connected to the rotation mechanism RTM, abearing 18 supporting the rotating shaft 16, and a gear mechanism 14that transmits an output (pivot) of the motor 12 to the rotating shaft16. The rotation mechanism RTM can include, for example, a motor 32, arotating shaft 38 supporting the cathode C, and a gear mechanism 36 thattransmits an output (pivot) of the motor 32 to the rotating shaft 38.

The film formation portion DP (see FIG. 3) of the substrate S can changeas the substrate S is conveyed by the conveyance mechanisms CMA. Therotation mechanism RTM and the movement mechanism RVM can adjust orcontrol, under the control of the control unit CNT, the posture andposition of the cathode C (target T) such that the angle between anormal NS of the film formation portion DP of the substrate S and anormal NT (a normal of the particle source) of the surface of the targetT is set to a predetermined angle. Preferably, the rotation mechanismRTM and the movement mechanism RVM can adjust or control, under thecontrol of the control unit CNT, the posture and position of the cathodeC (target T) such that the normal NS of the film formation portion DP ofthe substrate S becomes parallel to a normal NT of the surface of thetarget T.

Further, the rotation mechanism RTM and the movement mechanism RVM canadjust or control, under the control of the control unit CNT, theposture and position of the cathode C (target T) such that the anglebetween the normal NS of the film formation portion DP of the substrateS and the normal NT of the surface of the target T is set to thepredetermined angle and the distance between the film formation portionDP and the target T is set to the predetermined distance. Preferably,the rotation mechanism RTM and the movement mechanism RVM can adjust orcontrol, under the control of the control unit CNT, the posture andposition of the cathode C (target T) such that the normal NS of the filmformation portion DP of the substrate S becomes parallel to the normalNT of the surface of the target T and the distance between the filmformation portion DP and the target T is set to the predetermineddistance.

A rotation axis RTA can be parallel to a second direction (a directionparallel to the X-axis) orthogonal to a first direction parallel to theconveyance direction (the direction parallel to the Y-axis) of thesubstrate S by the conveyance mechanism CMA, and a revolution axis RVAof the revolution orbit OB can be parallel to the second direction.

FIGS. 4 to 6 show, in time series, a process in which a film is formedon the substrate S by sputtering in the sputtering apparatus 1. Theprocess advances in the order of states S11, S12, S13, S14, S15, S16,S17, S18, and S19. The substrate S includes one end E1 in the conveyancedirection by the conveyance mechanism CMA and the other end E2 in theconveyance direction by the conveyance mechanism CMA, and a film can beformed in a region from the one end E1 to the other end E2.

In the process exemplarily shown in FIGS. 4 to 6, the surface of thesubstrate S has a concave shape in a section (X-Z section) along theconveyance direction. In the example shown in FIGS. 4 to 6, while thesubstrate S is conveyed in the conveyance direction by the conveyancemechanism CMA and a film is formed in the region from the one end E1 tothe other end E2 of the substrate S, the movement mechanism RVM makesthe cathode C (target T) pivot along the revolution orbit OB in a firstrevolution direction, and then makes it pivot along the revolution orbitOB in a second revolution direction opposite to the first revolutiondirection. Further, in the example shown in FIGS. 4 to 6, while thesubstrate S is conveyed in the conveyance direction by the conveyancemechanism CMA and the film is formed in the region from the one end E1to the other end E2 of the substrate S, the rotation mechanism RTM makesthe cathode C (target T) pivot about the rotation axis RTA only in onerotation direction.

In one arrangement example, the cathode C is arranged above theconveyance surface CS, and the lowest point of the revolution orbit OBis lower than the allowable highest point of the substrate S (thehighest point in the substrate S that can be processed in the sputteringapparatus 1). In another arrangement example, the cathode C is arrangedabove the conveyance surface CS, and the lowest point of the revolutionorbit OB is higher than the allowable highest point of the substrate S(the highest point in the substrate S that can be processed in thesputtering apparatus 1).

Before starting film formation on the substrate S, in a state in whicheach of the target T and the cathode C is retracted to a position atwhich it does not collide with the substrate S, the substrate S can beconveyed by the conveyance mechanism CMA to a position indicated as thestate S11. Then, the rotation mechanism RTM and the movement mechanismRVM can control, under the control of the control unit CNT, the postureand position of the cathode C (target T) such that the normal NS of thefilm formation portion DP of the substrate S becomes parallel to thenormal NT of the surface of the target T and the distance between thefilm formation portion DP and the target T is set to a target distance.With this operation, the relative position and posture between thesubstrate S and the target T are set as shown in the state S11. In thisstate, the process of forming a film on the substrate S while conveyingthe substrate S by the conveyance mechanism CMA is started.

Subsequently, the process advances to the state S19 through the statesS12, S13, S14, S15, S16, S17, and S18, and the film formation in theregion from the one end E1 to the other end E2 is completed. Thereafter,in a state in which each of the target T and the cathode C is retractedto the position at which it does not collide with the substrate S, thesubstrate S is conveyed from the sputtering chamber CA to the load lockchamber CB by the conveyance mechanisms CMA and CMB, and furtherconveyed to the port CC by the conveyance mechanisms CMB and CMC.

According to this embodiment, the rotation mechanism RTM that makes thecathode C pivot about the rotation axis and the movement mechanism RVMthat moves the cathode C so as to change the distance between thecathode C and the conveyance surface CS are provided, so that a film canbe formed on the surface S having the concave shape while conveying thesubstrate S. Such an arrangement is more advantageous in reducing thesize of the sputtering apparatus than the arrangement in which therelative position and posture between the target and the substrate areadjusted or controlled by making the substrate S revolve or pivot.

FIG. 7 shows the second embodiment of a sputtering apparatus 1 or asputtering chamber CA. Components not described as the second embodimentcan follow the first embodiment described with reference to FIGS. 1 to6. In the second embodiment, the movement mechanism RVM in the firstembodiment is changed to a movement mechanism RVM′. The movementmechanism RVM′ is embodied as an elevation mechanism that elevates acathode C, thereby moving the cathode C such that the distance betweenthe cathode C and a conveyance surface CS (film formation portion) ischanged.

The present invention is not limited to the above-described embodiments,and various changes and modifications can be made within the sprit andscope of the present invention. Therefore, to apprise the public of thescope of the present invention, the following claims are made.

REFERENCE SIGNS LIST

1: sputtering apparatus, CA: sputtering chamber, CB: load lock chamber,CC: port, CMA: conveyance mechanism, CMB: conveyance mechanism, CMC:conveyance mechanism, CS: conveyance surface, C: cathode, T: target, S:substrate, RTM: rotation mechanism, RVM: movement mechanism (revolutionmechanism), RVM′: movement mechanism (elevation mechanism), RTA:rotation axis, RVA: revolution axis, OB: revolution orbit, DP: filmformation portion

1. A substrate processing apparatus that processes a substrate usingparticles, comprising: a conveyance mechanism configured to convey thesubstrate in a predetermined conveyance direction along a conveyancesurface; a particle source configured to emit particles; a rotationmechanism configured to make the particle source pivot about a rotationaxis orthogonal to the conveyance direction; and a movement mechanismconfigured to move the particle source such that a distance between theparticle source and the conveyance surface is changed.
 2. The substrateprocessing apparatus according to claim 1, wherein a target processingportion of the substrate changes as the substrate is conveyed by theconveyance mechanism, and the rotation mechanism and the movementmechanism control a posture and a position of the particle source suchthat an angle between a normal of the target processing portion of thesubstrate and a normal of the particle source is set to a predeterminedangle.
 3. The substrate processing apparatus according to claim 1,wherein a target processing portion of the substrate changes as thesubstrate is conveyed by the conveyance mechanism, and the rotationmechanism and the movement mechanism control a posture and a position ofthe particle source such that a normal of the target processing portionof the substrate becomes parallel to a normal of the particle source. 4.The substrate processing apparatus according to claim 2, wherein therotation mechanism and the movement mechanism control the posture andthe position of the particle source such that a distance between thetarget processing portion and the particle source is set to apredetermined distance.
 5. The substrate processing apparatus accordingto claim 1, wherein by making the particle source pivot along arevolution orbit, the movement mechanism moves the particle source suchthat the distance between the particle source and the conveyance surfaceis changed.
 6. The substrate processing apparatus according to claim 5,wherein a revolution axis of the revolution orbit is parallel to therotation axis.
 7. The substrate processing apparatus according to claim6, wherein while the substrate is conveyed in the conveyance directionby the conveyance mechanism and a film is formed in a region from oneend of the substrate in the conveyance direction to the other end of thesubstrate in the conveyance direction, the movement mechanism makes theparticle source pivot along the revolution orbit in a first revolutiondirection, and then makes the particle source pivot along the revolutionorbit in a second revolution direction opposite to the first revolutiondirection.
 8. The substrate processing apparatus according to claim 6,wherein while the substrate is conveyed in the conveyance direction bythe conveyance mechanism and a film is formed in a region from one endof the substrate in the conveyance direction to the other end of thesubstrate in the conveyance direction, the rotation mechanism makes theparticle source pivot about the rotation axis only in one rotationdirection.
 9. The substrate processing apparatus according to claim 1,wherein by elevating the particle source, the movement mechanism movesthe particle source such that the distance between the particle sourceand the conveyance surface is changed.
 10. The substrate processingapparatus according to claim 1, further comprising a control unitconfigured to generate, based on surface shape information indicating ashape of a surface of the substrate, control information for controllingthe rotation mechanism and the movement mechanism.
 11. The substrateprocessing apparatus according to claim 10, further comprising ameasurement device configured to measure a shape of the substrate togenerate the surface shape information.
 12. The substrate processingapparatus according to claim 1, wherein the particle source is a targetheld by a cathode, and the substrate processing apparatus forms a filmon the substrate using particles emitted by sputtering of the cathode.13. The substrate processing apparatus according to claim 1, wherein theparticle source is an ion beam source.
 14. A substrate processing methodof processing a substrate, comprising: a processing step of processingthe substrate using particle emitted from a particle source whileconveying the substrate in a predetermined conveyance direction along aconveyance surface and controlling a posture and a position of theparticle source that emits particles, wherein a target processingportion of the substrate changes as the substrate is conveyed, and theprocessing step includes a driving step of, in accordance with a changeof the target processing portion of the substrate, making the particlesource pivot about a rotation axis orthogonal to the conveyancedirection and moving the particle source such that a distance betweenthe particle source and the conveyance surface is changed.
 15. Thesubstrate processing method according to claim 14, wherein in thedriving step, the posture and the position of the particle source iscontrolled such that an angle between a normal of the target processingportion of the substrate and a normal of the particle source is set to apredetermined angle.
 16. The substrate processing method according toclaim 14, wherein in the driving step, the posture and the position ofthe particle source is controlled such that a normal of the targetprocessing portion of the substrate becomes parallel to a normal of theparticle source.
 17. The substrate processing method according to claim15, wherein in the driving step, the posture and the position of theparticle source is controlled such that a distance between the targetprocessing portion and the particle source is set to a predetermineddistance.
 18. The substrate processing method according to claim 14,wherein the particle source is a target held by a cathode, and a film isformed on the substrate using particles emitted by sputtering of thecathode.
 19. The substrate processing method according to claim 14,wherein the particle source is an ion beam source.
 20. The substrateprocessing method according to claim 14, wherein in the driving step, bymaking the particle source pivot along a revolution orbit around arevolution axis parallel to the rotation axis, the particle source ismoved such that the distance between the particle source and theconveyance surface is changed.